Material properties and room-temperature nuclear detector response of wide bandgap semiconductors

被引:22
作者
Schieber, M
Lund, JC
Olsen, RW
McGregor, DS
VanScyoc, JM
James, RB
Soria, E
Bauser, E
机构
[1] SANDIA NATL LABS,MAT DEV & DIAGNOST,LIVERMORE,CA 94550
[2] MAX PLANCK INST FESTKORPERFORSCH,D-70506 STUTTGART,GERMANY
[3] HEBREW UNIV JERUSALEM,JERUSALEM,ISRAEL
关键词
D O I
10.1016/0168-9002(96)00030-7
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Several semiconductor materials for room-temperature X-ray and gamma-ray detectors, including HgI2, Cd1-xZnxTe (CZT), GaAs, and PbI2 have been studied at Sandia National Laboratories, California. A comparison of the spectral response of these detectors will be given and related to material properties, such as charge carrier drift length, crystal purity, structural perfection, acid material stoichiometry, as well as to the crystal growth techniques and device fabrication processes published elsewhere. Room-temperature detector spectral responses for each of these materials are presented, for photon energies in the range of 5.9 to 662 keV. CZT and HgI2 detectors demonstrate excellent energy resolution over the entire energy range, while PbI2 detectors exhibit reasonable response only up to about 30 keV. Some of the semi-insulating GaAs detectors fabricated from vertical gradient freeze materials show good spectral resolution for lower energies up to similar to 60 keV, whereas other SI-GaAs detectors studied at Sandia function only as counters. Finally, some predictions on the future materials development of these wide bandgap semiconductors for room-temperature radiation detector applications will be discussed.
引用
收藏
页码:492 / 495
页数:4
相关论文
共 13 条
[1]   CD1-XZNXTE4 GAMMA-RAY DETECTORS [J].
BUTLER, JF ;
LINGREN, CL ;
DOTY, FP .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1992, 39 (04) :605-609
[2]  
GERRISH VM, 1983, J CRYST GROWTH, V65, P129
[3]  
JAMES RB, 1983, J CRYST GROWTH, V65, P103
[4]  
JAMES RB, 1995, SEMICONDUCTORS ROOM, P336
[5]  
MCGREGOR DS, 1995, SEMICONDUCTORS ROOM, P384
[6]  
MEDLIN DL, IN PRESS NUCL INSTR
[7]   HOLE DIFFUSION LENGTH IN HIGH-PURITY GAAS [J].
RYAN, RD ;
EBERHARDT, JE .
SOLID-STATE ELECTRONICS, 1972, 15 (08) :865-+
[8]   BULK AND SURFACE STOICHIOMETRY OF VAPOR-GROWN MERCURIC IODIDE-CRYSTALS [J].
SCHIEBER, M ;
ROTH, M ;
YAO, H ;
DEVRIES, M ;
JAMES, RB ;
GOORSKY, M .
JOURNAL OF CRYSTAL GROWTH, 1995, 146 (1-4) :15-22
[9]   CRYSTAL-GROWTH AND APPLICATIONS OF MERCURIC IODIDE [J].
SCHIEBER, M ;
ROTH, M ;
SCHNEPPLE, WF .
JOURNAL OF CRYSTAL GROWTH, 1983, 65 (1-3) :353-364
[10]  
SCHIEBER M, 1993, MATER RES SOC SYMP P, V302, P347, DOI 10.1557/PROC-302-347