Multiplicity analysis: a study of secondary particle distribution and correlation

被引：9

作者：

da Silveira, EF

Duarte, SB

Schweikert, EA

机构：

[1] Pontificia Univ Catolica Rio de Janeiro, Dept Fis, BR-22452970 Rio De Janeiro, Brazil

[2] Ctr Brasileiro Pesquisas Fis, BR-22290180 Rio De Janeiro, Brazil

[3] Texas A&M Univ, Ctr Chem Characterizat & Anal, College Stn, TX 77843 USA

来源：

SURFACE SCIENCE | 1998年 / 408卷 / 1-3期

基金：

美国国家科学基金会;

关键词：

correlation coefficient; multiplicity; random emission; secondary emission;

D O I：

10.1016/S0039-6028(98)00111-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

A statistical treatment of the number of secondary electrons, ions or neutrals emitted as a consequence of projectile-solid collision is described. The multiplicity distribution of the ejected particles and their correlation coefficients Q are defined and discussed. A random emission model is analyzed analytically and some of its predictions are compared with Monte Carlo simulations. This treatment provides basic grounds for coincidence counting analysis. It is shown that the secondary ion emission of certain systems is strongly correlated, thus providing information about their desorption mechanism. Background material in statistics and the Monte Carlo algorithm used are presented in Appendices A-D. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：28 / 42

页数：15

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