Dynamic force spectroscopy using the frequency modulation technique with constant excitation -: art. no. 153401

被引:34
作者
Hölscher, H
Gotsmann, B
Schirmeisen, A
机构
[1] Ctr Adv European Studies & Res, D-53111 Bonn, Germany
[2] IBM Corp, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland
[3] Univ Munster, Inst Phys, D-48149 Munster, Germany
来源
PHYSICAL REVIEW B | 2003年 / 68卷 / 15期
关键词
D O I
10.1103/PhysRevB.68.153401
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We investigate the measurement principle of a dynamic force microscope utilizing the frequency modulation technique with a constant excitation (CE) mode which has been successfully applied in vacuum, air, and liquids. The basic principles of this mode are comparable with the constant amplitude (CA) mode, but in difference to the CA mode the excitation amplitude is kept constant in the CE mode. Using an theoretical approach we show how the measured quantities of the CE mode-the frequency shift and the oscillation amplitude - are related to the tip-sample interaction force. Based on this analysis we demonstrate how dynamic force spectroscopy experiments can be done also in the CE mode.
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页数:4
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