18O Tracer Study of Porous Film Growth on Aluminum in Phosphoric Acid

被引：38

作者：

Baron-Wiechec, A. ^{[1
]}

Ganem, J. J. ^{[2
]}

Garcia-Vergara, S. J. ^{[3
]}

Skeldon, P. ^{[1
]}

Thompson, G. E. ^{[1
]}

Vickridge, I. C. ^{[2
]}

机构：

[1] Univ Manchester, Sch Mat, Ctr Corros & Protect, Manchester M17 9PL, Lancs, England

[2] Univ Paris 06, SAFIR, Inst Nano Sci Paris, F-75252 Paris 05, France

[3] Univ Ind Santander, Escuela Ingn Met & Ciencia Mat, Grp Invest Corros, Bucaramanga, Colombia

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 2010年 / 157卷 / 11期

基金：

英国工程与自然科学研究理事会;

关键词：

ANODIC OXIDE-FILMS; NARROW-RESONANCE; NUCLEAR MICROANALYSIS; THERMAL-OXIDATION; TRANSPORT NUMBERS; HARD ANODIZATION; HIGH-TEMPERATURE; BARRIER FILMS; OXYGEN; MECHANISM;

D O I：

10.1149/1.3490640

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

(18)O tracer is used to investigate the development of porous anodic films at constant current in phosphoric acid on electropolished aluminum. A barrier layer and porous region form initially with the pore size related to the surface texture of the substrate. Subsequently, major pores emerge, with their sizes related to the anodizing voltage. The evolution of the film is accompanied by increases in growth rate and formation efficiency. The (18)O ions of a preformed oxide are retained in the film during anodization in a nonenriched electrolyte, with (18)O being partitioned among (i) the surface region of texture-dependent porosity, (ii) the walls of major pores, and, in diminishing amounts, (iii) the inner region of the barrier layer. (c) 2010 The Electrochemical Society. [DOI: 10.1149/1.3490640] All rights reserved.

引用

页码：C399 / C407

页数：9

共 65 条

[1] Use of isotopic tracers and SIMS analysis for evaluating the oxidation behaviour of protective coatings on nickel based superalloys [J].

Alibhai, AA ;

Chater, RJ ;

McPhail, DS ;

Shollock, BA .

APPLIED SURFACE SCIENCE, 2003, 203 :630-633

[2] MICROANALYSIS OF STABLE ISOTOPES OF OXYGEN BY MEANS OF NUCLEAR REACTIONS [J].

AMSEL, G ;

SAMUEL, D .

ANALYTICAL CHEMISTRY, 1967, 39 (14) :1689-&

[3] MECHANISM OF ANODIC OXIDATION [J].

AMSEL, G ;

SAMUEL, D .

JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1962, 23 (DEC) :1707-&

[4] USE OF NUCLEAR MICROANALYSIS OF LIGHT ELEMENTS IN ELECTROCHEMISTRY APPLICATIONS TO ANODIC OXIDATION PROCESSES BY DIRECT DETERMINATION OF O-16 AND BY O-18 TRACING [J].

AMSEL, G ;

CHERKI, C ;

CROSET, M ;

FEUILLAD.G ;

NADAI, JP ;

ORTEGA, C ;

RIGO, S ;

SIEJKA, J .

COLLECTION OF CZECHOSLOVAK CHEMICAL COMMUNICATIONS, 1971, 36 (02) :883-&

[5]

[Anonymous], SURFACE TREATMENT FI

[6] THE MECHANISM AND KINETICS OF THE OXIDATION OF CR(100) SINGLE-CRYSTAL SURFACES STUDIED BY REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION, X-RAY-EMISSION SPECTROSCOPY, AND SECONDARY ION MASS-SPECTROMETRY AUGER SPUTTER DEPTH PROFILING [J].

ARLOW, JS ;

MITCHELL, DF ;

GRAHAM, MJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (04) :572-576

[7] Influence of crystal orientation and surface topography of aluminum substrate on pore nucleation of anodic porous alumina [J].

Kogakuin University ;

不详 ;

不详 .

Keikinzoku J Jpn Inst Light Met, 2008, 8 (375-380) :375-380

[8] A VERY NARROW RESONANCE IN O-18(P,ALPHA) N-15 NEAR 150 KEV - APPLICATION TO ISOTOPIC TRACING .2. HIGH-RESOLUTION DEPTH PROFILING OF O-18 [J].

BATTISTIG, G ;

AMSEL, G ;

DARTEMARE, E ;

VICKRIDGE, I .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1992, 66 (1-2) :1-10

[9] A VERY NARROW RESONANCE IN O-18(P, ALPHA)N-15 NEAR 150 KEV - APPLICATION TO ISOTOPIC TRACING .1. RESONANCE WIDTH MEASUREMENT [J].

BATTISTIG, G ;

AMSEL, G ;

DARTEMARE, E ;

VICKRIDGE, I .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1991, 61 (04) :369-376

[10] MECHANICAL PROPERTIES OF THIN ANODIC FILMS ON ALUMINUM [J].

BRADHURST, DH ;

LEACH, JSL .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1966, 113 (12) :1245-+

← 1 2 3 4 5 6 7 →