THE MECHANISM AND KINETICS OF THE OXIDATION OF CR(100) SINGLE-CRYSTAL SURFACES STUDIED BY REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION, X-RAY-EMISSION SPECTROSCOPY, AND SECONDARY ION MASS-SPECTROMETRY AUGER SPUTTER DEPTH PROFILING

被引：21

作者：

ARLOW, JS

MITCHELL, DF

GRAHAM, MJ

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1987年 / 5卷 / 04期

关键词：

D O I：

10.1116/1.574675

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：572 / 576

页数：5

共 11 条

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[2] A STRUCTURAL AND KINETIC-STUDY OF CHLORINE CHEMISORPTION AND SURFACE CHLORIDE FORMATION ON CR(100)
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[3] THE (100) SURFACES OF CHROMIUM AND VANADIUM - RECONSIDERATIONS OF THEIR STRUCTURE AND REACTIVITY
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REED, APC
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[J]. SURFACE SCIENCE, 1983, 129 (01) : 79 - 91
[4] OXYGEN-CHEMISORPTION AND CORROSION ON CR(100) AND CR(110) SINGLE-CRYSTAL SURFACES
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[J]. SURFACE SCIENCE, 1985, 161 (2-3) : 513 - 520
[5] HILTY DC, 1955, T AM I MIN MET ENG, V203, P253
[6] OXYGEN-TRANSPORT IN GROWING OXIDE-FILMS ON CHROMIUM AS STUDIED BY O-18-SIMS
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[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1984, 2 (02): : 789 - 791
[7] QUANTITATIVE-DETERMINATION OF OXYGEN IN THIN OXIDE-FILMS ON METALS BY ELECTRON-EXCITED X-RAY-EMISSION
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[J]. THIN SOLID FILMS, 1974, 23 (01) : 109 - 125
[8] ANALYSIS OF OXYGEN ISOTOPE INTERFACES USING NEGATIVE MOLECULAR ION SIMS
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[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (02): : 1006 - 1008
[9] KINETIC STUDY OF INITIAL OXIDATION OF NI(110) SURFACE BY RHEED AND X-RAY-EMISSION
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COHEN, M
[J]. SURFACE SCIENCE, 1977, 69 (01) : 310 - 324
[10] MITCHELL DF, 1983, 1981 P NACE INT C HI, P18

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