18O Tracer Study of Porous Film Growth on Aluminum in Phosphoric Acid

被引：38

作者：

Baron-Wiechec, A. ^{[1
]}

Ganem, J. J. ^{[2
]}

Garcia-Vergara, S. J. ^{[3
]}

Skeldon, P. ^{[1
]}

Thompson, G. E. ^{[1
]}

Vickridge, I. C. ^{[2
]}

机构：

[1] Univ Manchester, Sch Mat, Ctr Corros & Protect, Manchester M17 9PL, Lancs, England

[2] Univ Paris 06, SAFIR, Inst Nano Sci Paris, F-75252 Paris 05, France

[3] Univ Ind Santander, Escuela Ingn Met & Ciencia Mat, Grp Invest Corros, Bucaramanga, Colombia

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 2010年 / 157卷 / 11期

基金：

英国工程与自然科学研究理事会;

关键词：

ANODIC OXIDE-FILMS; NARROW-RESONANCE; NUCLEAR MICROANALYSIS; THERMAL-OXIDATION; TRANSPORT NUMBERS; HARD ANODIZATION; HIGH-TEMPERATURE; BARRIER FILMS; OXYGEN; MECHANISM;

D O I：

10.1149/1.3490640

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

(18)O tracer is used to investigate the development of porous anodic films at constant current in phosphoric acid on electropolished aluminum. A barrier layer and porous region form initially with the pore size related to the surface texture of the substrate. Subsequently, major pores emerge, with their sizes related to the anodizing voltage. The evolution of the film is accompanied by increases in growth rate and formation efficiency. The (18)O ions of a preformed oxide are retained in the film during anodization in a nonenriched electrolyte, with (18)O being partitioned among (i) the surface region of texture-dependent porosity, (ii) the walls of major pores, and, in diminishing amounts, (iii) the inner region of the barrier layer. (c) 2010 The Electrochemical Society. [DOI: 10.1149/1.3490640] All rights reserved.

引用

页码：C399 / C407

页数：9

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