Microstructure and strain relaxation in YBa2Cu3O7 epitaxial thin films

被引：21

作者：

Maurice, JL ^{[1
]}

Durand, O

Drouet, M

Contour, JP

机构：

[1] Thomson CSF, CNRS, Unite Mixte Phys, F-91404 Orsay, France

[2] Thomson CSF, LCR, F-91404 Orsay, France

来源：

THIN SOLID FILMS | 1998年 / 319卷 / 1-2期

关键词：

dislocations; epitaxial thin films; microstructure; strain relaxation;

D O I：

10.1016/S0040-6090(97)01124-3

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We present X-ray diffraction (XRD) and transmission electron microscopy (TEM) observations of microstructure and strain relaxation in YBa2Cu3O7 (YBCO) thin films grown on SrTiO3 (STO). The observations confirm the existence of twins in the relaxed layers and their absence in the strained ones. Dislocations are also present at the interface. We discuss the respective roles of twins and dislocations in the relaxation process. (C) 1998 Published by Elsevier Science S.A.

引用

页码：211 / 214

页数：4

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