Nonlinearity and polarization effects in silicon trap detectors

被引:17
作者
Goebel, R [1 ]
Stock, M [1 ]
机构
[1] Bur Int Poids & Mesures, F-92312 Sevres, France
关键词
D O I
10.1088/0026-1394/35/4/33
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The study reported here was carried out as part of an international comparison of cryogenic radiometers, using silicon trap detectors as transfer instruments. Nonlinearity measurements are part of a more general characterization process of these detectors, including, among other parameters, spatial uniformity, temperature coefficient, sensitivity to beam polarization, and stability. When calibrated against cryogenic radiometers, the uncertainty in their calibration is of the order of 1 part in 10(4). The accuracy in the nonlinearity measurements should therefore be better than this value.
引用
收藏
页码:413 / 418
页数:6
相关论文
共 10 条
[1]   AUTOMATED ABSOLUTE AND RELATIVE SPECTRAL LINEARITY MEASUREMENTS ON PHOTOVOLTAIC DETECTORS [J].
BOIVIN, LP .
METROLOGIA, 1993, 30 (04) :355-360
[2]   PHOTODIODE NONLINEARITY MEASUREMENT WITH AN INTENSITY STABILIZED LASER AS A RADIATION SOURCE [J].
FISCHER, J ;
FU, L .
APPLIED OPTICS, 1993, 32 (22) :4187-4190
[3]   TRAP DETECTORS AND THEIR PROPERTIES [J].
FOX, NP .
METROLOGIA, 1991, 28 (03) :197-202
[4]   TRANSMISSION TRAP DETECTORS [J].
GARDNER, JL .
APPLIED OPTICS, 1994, 33 (25) :5914-5918
[5]   Polarization dependence of trap detectors [J].
Goebel, R ;
Yilmaz, S ;
Pello, R .
METROLOGIA, 1996, 33 (03) :207-213
[6]   Characterization of a polarization-independent transmission trap detector [J].
Kubarsepp, T ;
Karha, P ;
Ikonen, E .
APPLIED OPTICS, 1997, 36 (13) :2807-2812
[7]   CHARACTERIZATION OF PHOTODIODES IN THE UV AND VISIBLE SPECTRAL REGION-BASED ON CRYOGENIC RADIOMETRY [J].
LEI, F ;
FISCHER, J .
METROLOGIA, 1993, 30 (04) :297-303
[8]   PRINCIPLE AND APPLICATION OF DIFFERENTIAL SPECTRORADIOMETRY [J].
METZDORF, J ;
MOLLER, W ;
WITTCHEN, T ;
HUNERHOFF, D .
METROLOGIA, 1991, 28 (03) :247-250
[9]   SILICON DETECTOR NONLINEARITY AND RELATED EFFECTS [J].
SCHAEFER, AR ;
ZALEWSKI, EF ;
GEIST, J .
APPLIED OPTICS, 1983, 22 (08) :1232-1236
[10]  
STOCK KD, 1995, PTB ANN REPORT