Nanomechanical mapping with resonance tracking scanned probe microscope

被引：62

作者：

Kos, A. B. ^{[1
]}

Hurley, D. C. ^{[1
]}

机构：

[1] Natl Inst Stand & Technol, Boulder, CO 80305 USA

来源：

MEASUREMENT SCIENCE AND TECHNOLOGY | 2008年 / 19卷 / 01期

关键词：

atomic force acoustic microscopy; atomic force microscope; contact-resonance spectroscopy; digital signal processor; elastic modulus; rms-to-dc converter; scanned probe microscopy;

D O I：

10.1088/0957-0233/19/1/015504

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We present a new digital-signal-processor-based resonance tracking system for scanned probe microscopy (SPM) imaging. The system was developed to enable quantitative imaging of mechanical properties with nanoscale spatial resolution at practical data acquisition rates. It consists of a 32-bit floating-point digital signal processor connected to a high-resolution audio coder/decoder subsystem, an rms-to-dc converter and a voltage-controlled oscillator. These components are used in conjunction with a commercial atomic force microscope to create a versatile platform for SPM mechanical mapping. Images of a glass-fibre/polymer matrix composite sample are presented to demonstrate system performance.

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页数：9

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