Thickness-driven antiferroelectric-to-ferroelectric phase transition of thin PbZrO3 layers in epitaxial PbZrO3/Pb(Zr0.8Ti0.2)O3 multilayers

被引:48
作者
Boldyreva, Ksenia
Pintilie, Lucian
Lotnyk, Andriy
Misirlioglu, I. B.
Alexe, Marin
Hesse, Dietrich
机构
[1] Max Planck Inst Microstruct Phys, D-06120 Halle, Germany
[2] NIMP, Bucharest 077125, Romania
关键词
D O I
10.1063/1.2789401
中图分类号
O59 [应用物理学];
学科分类号
摘要
Epitaxial antiferroelectric/ferroelectric PbZrO3/PbZr0.8Ti0.2O3 multilayers were grown on SrRuO3-electroded SrTiO3(100) substrates by pulsed laser deposition. Polarization-field and switching current-voltage curves show a mixed antiferroelectric-ferroelectric behavior of the multilayers with an individual layer thickness above 10 nm, whereas below 10 nm the multilayers show only ferroelectric behavior. Clearly the PbZrO3 layers thinner than 10 nm experienced a transition into the ferroelectric state. X-ray diffraction reciprocal space mapping showed a corresponding orthorhombic-to-rhombohedral transition of the PbZrO3 layers. The observations are discussed in terms of the influence of strain.
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页数:3
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