230% room-temperature magnetoresistance in CoFeB/MgO/CoFeB magnetic tunnel junctions

被引:774
作者
Djayaprawira, DD
Tsunekawa, K
Nagai, M
Maehara, H
Yamagata, S
Watanabe, N
Yuasa, S
Suzuki, Y
Ando, K
机构
[1] Anelva Corp, Electron Device Equipment Div, Fuchu, Tokyo 1838508, Japan
[2] Natl Inst Adv Ind Sci & Technol, Nanoelect Res Inst, Tsukuba, Ibaraki 3058568, Japan
[3] Japan Sci & Technol Agcy, PRESTO, Kawaguchi, Saitama 3320012, Japan
[4] Osaka Univ, Grad Sch Engn Sci, Osaka 5608531, Japan
关键词
D O I
10.1063/1.1871344
中图分类号
O59 [应用物理学];
学科分类号
摘要
Magnetoresistance (MR) ratio up to 230% at room temperature (294% at 20 K) has been observed in spin-valve-type magnetic tunnel junctions (MTJs) using MgO tunnel barrier layer fabricated on thermally oxidized Si substrates. We found that such a high MR ratio can be obtained when the MgO barrier layer was sandwiched with amorphous CoFeB ferromagnetic electrodes. Microstructure analysis revealed that the MgO layer with (001) fiber texture was realized when the MgO layer was grown on amorphous CoFeB rather than on polycrystalline CoFe. Since there have been no theoretical studies on the MTJs with a crystalline tunnel barrier and amorphous electrodes, the detailed mechanism of the huge tunneling MR effect observed in this study is not clear at the present stage. Nevertheless, the present work is of paramount importance in realizing high-density magnetoresistive random access memory and read head for ultra high-density hard-disk drives into practical use. (C) 2005 American Institute of Physics.
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页码:1 / 3
页数:3
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