A comparison between bottom contact and top contact all organic field effect transistors assembled by soft lithography

被引:27
作者
Cosseddu, P. [1 ]
Bonfiglio, A.
机构
[1] Univ Cagliari, INFM, Dept Elect & Elect Engn, I-09124 Cagliari, Italy
[2] INFM S3 NanoStruct & BioSyst Surfaces, Modena, Italy
关键词
OFETs; polymer; AFM; soft lithography;
D O I
10.1016/j.tsf.2006.11.182
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
All-organic Field Effect Transistors (FETs) on plastic were fabricated by means of an innovative, simple and inexpensive technique. A thin Mylar (R) foil acts both as substrate and gate dielectric. We used pentacene, deposited by thermal sublimation, as semiconducting layer while contacts were fabricated with poly(ethylene-dioxythiophene)/polystyrene sulfonate (PEDOT/PSS) by means of soft lithography. On the opposite side of the foil a thin PEDOT/PSS film, acting as gate electrode, was spin coated. It is worth noting that this technique allows the realization of bottom contact and top contact devices on the same substrate and with the same semiconducting layer. Furthermore, assisted by Scanning Probe Microscopy investigations, we investigated how the device structure influences its electrical properties in terms of hole mobility, Series Contact Resistance and parasitic capacitance effects. The comparison between top-contact and bottom-contact devices shows interesting marked differences that can be mainly attributed to a different quality of PEDOT/PSS-semiconductor interface. The flexibility of the obtained structure and the easy scalability of the technological process open the way for economic production of high-resolution organic devices. (c) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:7551 / 7555
页数:5
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