Temperature dependence of the electron-phonon scattering time of charge carriers in p-Si/SiGe heterojunctions

被引:8
作者
Andrievskii, VV
Berkutov, IB
Komnik, YF
Mironov, OA
Whall, TE
机构
[1] Natl Acad Sci Ukraine, B Verkin Inst Low Temp Phys & Engn, UA-61164 Kharkov, Ukraine
[2] Univ Warwick, Dept Phys, Coventry CV4 7AL, W Midlands, England
关键词
D O I
10.1063/1.1334440
中图分类号
O59 [应用物理学];
学科分类号
摘要
Si/Si0.64Ge0.36 heterojunctions with p-type conductivity exhibit an electron overheating effect. An analysis of the damping of the amplitudes of the Shubnikov-de Haas oscillations upon a change in temperature and applied electric field yields the temperature dependence of the electron-phonon relaxation time: t(eph)=10(-8)T(-2) s. (C) 2000 American Institute of Physics. [S1063-777X(00)00512-0].
引用
收藏
页码:890 / 893
页数:4
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