Substructure formation during pattern transposition from substrate into polymer blend film

被引:21
作者
Cyganik, P
Budkowski, A
Steiner, U
Rysz, J
Bernasik, A
Walheim, S
Postawa, Z
Raczkowska, J
机构
[1] Jagiellonian Univ, M Smoluchowski Inst Phys, PL-30059 Krakow, Poland
[2] Univ Groningen, Dept Polymer Chem, NL-9747 AG Groningen, Netherlands
[3] Stanislaw Staszic Univ Min & Met, Fac Phys & Nucl Tech, PL-30059 Krakow, Poland
[4] Forschungszentrum Karlsruhe, Inst Nanotechnol, D-76021 Karlsruhe, Germany
来源
EUROPHYSICS LETTERS | 2003年 / 62卷 / 06期
关键词
D O I
10.1209/epl/i2003-00451-1
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
A chemical pattern on a substrate is transposed into thin films of a ternary polymer blend during spin-casting from a common solvent. One of the blend components intercalates at interfaces between the other two phases to reduce their interfacial energy. As a result, an extensive substructure is formed, in addition to domains with pattern periodicity lambda. Morphologies with well-ordered lateral domains are created not only when the inherent scale of the phase domains R is comparable to lambda (as observed previously) but also for R similar to lambda/2, extending pattern transposition to smaller length scales.
引用
收藏
页码:855 / 861
页数:7
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