Maskless photolithography: Embossed photoresist as its own optical element

被引:55
作者
Paul, KE [1 ]
Breen, TL [1 ]
Aizenberg, J [1 ]
Whitesides, GM [1 ]
机构
[1] Harvard Univ, Dept Chem & Chem Biol, Cambridge, MA 02138 USA
关键词
D O I
10.1063/1.122621
中图分类号
O59 [应用物理学];
学科分类号
摘要
This letter demonstrates that features embossed on the surface of a layer of photoresist can direct UV light in the photoresist layer. These topographical features act as optical elements: they focus/ disperse and phase shift incident light in the optical near field, inside the resist layer. A number of different surface topographies have been examined, which give 50-250 nm features after exposure and development. This method gives patterns of complex features over large areas, in a parallel process, that can then be transferred into silicon or metal. It provides a method for controlling the intensity of light inside a thin film of photoresist. (C) 1998 American Institute of Physics. [S0003-6951(98)04746-9].
引用
收藏
页码:2893 / 2895
页数:3
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