Room-temperature reproducible spatial force spectroscopy using atom-tracking technique

被引:94
作者
Abe, M [1 ]
Sugimoto, Y [1 ]
Custance, O [1 ]
Morita, S [1 ]
机构
[1] Osaka Univ, Grad Sch Engn, Suita, Osaka 5650871, Japan
关键词
D O I
10.1063/1.2108112
中图分类号
O59 [应用物理学];
学科分类号
摘要
A method for reproducible site-specific force spectroscopic measurements using frequency modulation atomic force microscopy at room temperature is presented. The stability and reproducibility requirements, fulfilled so far only in cryogenic environment, are provided through the compensation of the thermal drift using the atom-tracking technique. The method has been tested performing spectroscopic measurements on atomic positions of the Si(111)-(7x7) surface with Si tips. The room-temperature results presented here compare in quality to previously reported quantitative force spectroscopic data obtained at cryogenic temperatures. (C) 2005 American Institute of Physics.
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页码:1 / 3
页数:3
相关论文
共 28 条
[1]  
ABE M, IN PRESS NANOTECHNOL
[2]   FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].
ALBRECHT, TR ;
GRUTTER, P ;
HORNE, D ;
RUGAR, D .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673
[3]   Atomic-resolution dynamic force microscopy and spectroscopy of a single-walled carbon nanotube: Characterization of interatomic van der Waals forces [J].
Ashino, M ;
Schwarz, A ;
Behnke, T ;
Wiesendanger, R .
PHYSICAL REVIEW LETTERS, 2004, 93 (13) :136101-1
[4]   Imaging the atomic arrangements on the high-temperature reconstructed α-Al2O3(0001) surface [J].
Barth, C ;
Reichling, M .
NATURE, 2001, 414 (6859) :54-57
[5]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[6]   Comparison of calibration methods for atomic-force microscopy cantilevers [J].
Burnham, NA ;
Chen, X ;
Hodges, CS ;
Matei, GA ;
Thoreson, EJ ;
Roberts, CJ ;
Davies, MC ;
Tendler, SJB .
NANOTECHNOLOGY, 2003, 14 (01) :1-6
[7]   A NONDESTRUCTIVE METHOD FOR DETERMINING THE SPRING CONSTANT OF CANTILEVERS FOR SCANNING FORCE MICROSCOPY [J].
CLEVELAND, JP ;
MANNE, S ;
BOCEK, D ;
HANSMA, PK .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (02) :403-405
[8]  
Dürig U, 2000, APPL PHYS LETT, V76, P1203, DOI 10.1063/1.125983
[9]   Atomic resolution on Si(111)-(7x7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork [J].
Giessibl, FJ .
APPLIED PHYSICS LETTERS, 2000, 76 (11) :1470-1472
[10]   Forces and frequency shifts in atomic-resolution dynamic-force microscopy [J].
Giessibl, FJ .
PHYSICAL REVIEW B, 1997, 56 (24) :16010-16015