A simple model for calculating proton induced SEU

被引:24
作者
Barak, J [1 ]
Levinson, J [1 ]
Akkerman, A [1 ]
Lifshitz, Y [1 ]
Victoria, M [1 ]
机构
[1] CRPP,FUS TECHNOL DIV,CH-5232 VILLIGEN PSI,SWITZERLAND
关键词
D O I
10.1109/23.510743
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new semi-empirical model for proton induced SEU is presented. For estimating the energy deposited by the protons in the sensitive volumes of the devices the model uses the measured spectra of surface barrier detectors (SBD) with the same thicknesses of the sensitive volume and at the same proton energies. Fitting the SBD spectra by exponential functions and the heavy ion induced cross sections by simple formulas results in simple expressions for the proton cross sections. The model predictions are in good agreement with the experimental results.
引用
收藏
页码:979 / 984
页数:6
相关论文
共 18 条
[1]  
AKKERMAN A, 1991, P RADECS 91 LA GRAND, P509
[2]  
AKKERMAN A, INPRESS RAD PHYS CHE
[3]   MONTE-CARLO CALCULATIONS OF HIGH-ENERGY NUCLEON-MESON CASCADES AND COMPARISON WITH EXPERIMENT [J].
ARMSTRONG, TW ;
ALSMILLER, RG ;
CHANDLER, KC ;
BISHOP, BL .
NUCLEAR SCIENCE AND ENGINEERING, 1972, 49 (01) :82-+
[4]   A MICROSCOPIC MODEL OF ENERGY DEPOSITION IN SILICON SLABS EXPOSED TO HIGH-ENERGY PROTONS [J].
AZZIZ, N ;
TANG, HHK ;
SRINIVASAN, GR .
JOURNAL OF APPLIED PHYSICS, 1987, 62 (02) :414-418
[5]  
BARAK J, 1995, P RADECS 95 AR FRANC
[6]   A MODEL FOR PROTON-INDUCED SEU [J].
BION, T ;
BOURRIEAU, J .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1989, 36 (06) :2281-2286
[7]   COMPARISON OF SOFT ERRORS INDUCED BY HEAVY-IONS AND PROTONS [J].
BISGROVE, JM ;
LYNCH, JE ;
MCNULTY, PJ ;
ABDELKADER, WG ;
KLETNIEKS, V ;
KOLASINSKI, WA .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1986, 33 (06) :1571-1576
[8]   CHARACTERIZATION OF PROTON INTERACTIONS IN ELECTRONIC COMPONENTS [J].
DOUCIN, B ;
PATIN, Y ;
LOCHARD, JP ;
BEAUCOUR, J ;
CARRIERE, T ;
ISABELLE, D ;
BUISSON, J ;
CORBIERE, T ;
BION, T .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1994, 41 (03) :593-598
[9]   CHARGE-DEPOSITION SPECTRA IN THIN SLABS OF SILICON INDUCED BY ENERGETIC PROTONS [J].
ELTELEATY, S ;
FARRELL, GE ;
MCNULTY, PJ .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1983, 30 (06) :4394-4397
[10]   SOFT FAILS IN MICROELECTRONIC CIRCUITS DUE TO PROTON-INDUCED NUCLEAR-REACTIONS IN MATERIAL SURROUNDING THE SEU-SENSITIVE VOLUME [J].
ELTELEATY, S ;
MCNULTY, PJ ;
ABDELKADER, WG ;
BEAUVAIS, WJ .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1989, 40-1 :1300-1305