Femtosecond laser-induced decomposition in triazenepolymer thin films

被引：7

作者：

Bonse, J

Wiggins, SM

Solis, J

Lippert, T

Sturm, H

机构：

[1] CSIC, Inst Opt, E-28006 Madrid, Spain

[2] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

[3] Project Grp Nanoanal Micro Syst Technol, BAM, D-12205 Berlin, Germany

来源：

APPLIED SURFACE SCIENCE | 2005年 / 248卷 / 1-4期

关键词：

laser-induced phase transitions; triazenepolymer film; femtosecond laser pulse irradiation; time-resolved reflectivity measurements; scanning force microscopy; ablation; damage;

D O I：

10.1016/j.apsusc.2005.03.021

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The damage induced by ultrashort, 130 fs, near-infrared, 800 nm, Ti:sapphire laser pulses in 1 mu m thick triazenepolymer films on glass substrates has been investigated. Real-time reflectivity measurements with a ps-resolution streak camera and a ns-resolution photodiode set-up have been performed to study in situ the structural transformation dynamics upon single-pulse excitation with laser fluences above the threshold of permanent damage. Scanning force microscopy has been used to probe ex situ the corresponding surface topography of the ablated spots. Modulated lateral force microscopy (M-LFM) has been a plied to observe alterations of the local friction properties within and around the irradiated areas. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：157 / 162

页数：6

共 17 条

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