Simultaneous observation of millisecond dynamics in atomistic structure, force and conductance on the basis of transmission electron microscopy

被引:77
作者
Kizuka, T [1 ]
Ohmi, H
Sumi, T
Kumazawa, K
Deguchi, S
Naruse, M
Fujisawa, S
Sasaki, S
Yabe, A
Enomoto, Y
机构
[1] Nagoya Univ, Sch Engn, Nagoya, Aichi 4648603, Japan
[2] JEOL Ltd, Tokyo 1968558, Japan
[3] Mech Engn Lab, Tsukuba, Ibaraki 3058564, Japan
[4] Nagoya Univ, Res Ctr Adv Waste & Emiss Management, Nagoya, Aichi 4648603, Japan
[5] Japan Sci & Technol Corp, Precursory Res Embryon Sci & Technol, Nagoya, Aichi 4648603, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 2001年 / 40卷 / 2B期
关键词
nanotechnology; atomic-scale mechanics of materials; point contact; transmission electron microscopy; atomic force microscopy;
D O I
10.1143/JJAP.40.L170
中图分类号
O59 [应用物理学];
学科分类号
摘要
High-resolution transmission electron microscopy (HRTEM) has been developed to possess functions of atomic force microscopy and scanning tunneling microscopy. Dynamics of subnano Newton-scale force and conductance were simultaneously observed at intervals of 1/30-1/3840 s during HRTEM imaging of contact, deformation and fracture processes between nanometer-sized tips. The experimental basis of the atomic-scale mechanics of materials was developed on the basis of the present microscopy.
引用
收藏
页码:L170 / L173
页数:4
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