Scanning probe microscopes go video rate and beyond

被引:171
作者
Rost, MJ
Crama, L
Schakel, P
van Tol, E
van Velzen-Williams, GBEM
Overgauw, CF
ter Horst, H
Dekker, H
Okhuijsen, B
Seynen, M
Vijftigschild, A
Han, P
Katan, AJ
Schoots, K
Schumm, R
van Loo, W
Oosterkamp, TH
Frenken, JWM
机构
[1] Leiden Univ, Kamerlingh Onnes Lab, NL-2300 RA Leiden, Netherlands
[2] Leiden Probe Microscopy BV, Kamerlingh Onnes Lab, NL-2333 CA Leiden, Netherlands
[3] FOM, Inst Atom & Mol Phys, NL-1098 SJ Amsterdam, Netherlands
[4] Penn State Univ, University Pk, PA 16802 USA
关键词
D O I
10.1063/1.1915288
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
In this article we introduce a, video-rate, control system that can be used with any type of scanning probe microscope, and that allows frame rates up to 200 images/s. These electronics are capable of measuring in a fast, completely analog mode as well as in the more conventional digital mode. The latter allows measurements at low speeds and options, such as, e.g., atom manipulation, current-voltage spectroscopy, or force-distance curves. For scanning tunneling microscope (STM) application we implemented a hybrid mode between the well-known constant-height and constant-current modes. This hybrid mode not only increases the maximum speed at which the surface can be imaged, but also improves the resolution at lower speeds. Acceptable image quality at high speeds could only be obtained by pushing the performance of each individual part of the electronics to its limit: we developed a preamplifier with a bandwidth of 600 kHz, a feedback electronics with a bandwidth of 1 MHz, a home-built bus structure for the fast data transfer, fast analog to digital converters, and low-noise drivers. Future improvements and extensions to the control electronics can be realized easily and quickly, because of its open architecture with its modular plug-in units. In the second part of this article we show our high-speed results. The ultrahigh vacuum application of these control electronics on our (UHV)-STM enabled imaging speeds up to 0.3 mm/s, while still obtaining atomic step resolution. At high frame rates, the images suffered from noticeable distortions, which we have been able to analyze by virtue of the unique access to the error (dZ) signal. The distortions have all been associated with mechanical resonances in the scan head of the UHV-STM. In order to reduce such resonance effects, we have designed and built a scan head with high resonance frequencies (>= 64 kHz), especially for the purpose of testing the fast electronics. Using this scanner we have reached video-rate imaging speeds up to 200 frames/s (5 ms/image), while still obtaining atomically resolved structures. (c) 2005 American Institute of Physics.
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页数:9
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共 25 条
[11]   DESIGN AND PERFORMANCE OF A HIGH-TEMPERATURE, HIGH-SPEED SCANNING TUNNELING MICROSCOPE [J].
KUIPERS, L ;
LOOS, RWM ;
NEERINGS, H ;
TERHORST, J ;
RUWIEL, GJ ;
DEJONGH, AP ;
FRENKEN, JWM .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (09) :4557-4565
[12]   STEP AND KINK DYNAMICS ON AU(110) AND PB(111) STUDIED WITH A HIGH-SPEED STM [J].
KUIPERS, L ;
HOOGEMAN, MS ;
FRENKEN, JWM ;
VANBEIJEREN, H .
PHYSICAL REVIEW B, 1995, 52 (15) :11387-11397
[13]   A high-pressure scanning tunneling microscope [J].
Laegsgaard, E ;
Osterlund, L ;
Thostrup, P ;
Rasmussen, PB ;
Stensgaard, I ;
Besenbacher, F .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2001, 72 (09) :3537-3542
[14]   Low noise current-to-voltage converter and vibration damping system for a low-temperature ultrahigh vacuum scanning tunneling microscope [J].
Libioulle, L ;
Radenovic, A ;
Bystrenova, E ;
Dietler, G .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2003, 74 (02) :1016-1021
[15]   Plug "n" play scanning probe microscopy [J].
Michely, T ;
Kaiser, M ;
Rost, MJ .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (12) :4461-4467
[16]   A servomechanism for a micro-electromechanical-system-based scanning-probe data storage device [J].
Pantazi, A ;
Lantz, MA ;
Cherubini, G ;
Pozidis, H ;
Eleftheriou, E .
NANOTECHNOLOGY, 2004, 15 (10) :S612-S621
[17]   The "reactor STM": A scanning tunneling microscope for investigation of catalytic surfaces at semi-industrial reaction conditions [J].
Rasmussen, PB ;
Hendriksen, BLM ;
Zeijlemaker, H ;
Ficke, HG ;
Frenken, JWM .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (11) :3879-3884
[18]   Grains, growth, and grooving [J].
Rost, MJ ;
Quist, DA ;
Frenken, JWM .
PHYSICAL REVIEW LETTERS, 2003, 91 (02)
[19]   Comment on "Real space investigation of the roughening and deconstruction transitions of Au(110)" [J].
Rost, MJ ;
Frenken, JWM .
PHYSICAL REVIEW LETTERS, 2001, 87 (03) :39603-1
[20]   Scanning tunnelling microscopy in extreme fields: very low temperature, high magnetic field, and extreme high vacuum [J].
Sagisaka, K ;
Kitahara, M ;
Fujita, D ;
Kido, G ;
Koguchi, N .
NANOTECHNOLOGY, 2004, 15 (06) :S371-S375