Direct measurement of refractive-index dispersion of transparent media by white-light interferometry

被引：40

作者：

Galli, M ^{[1
]}

Marabelli, F ^{[1
]}

Guizzetti, G ^{[1
]}

机构：

[1] Univ Pavia, INFM, Dipartimento Fis A Volta, I-27100 Pavia, Italy

来源：

APPLIED OPTICS | 2003年 / 42卷 / 19期

关键词：

D O I：

10.1364/AO.42.003910

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We report on a technique for measuring the refractive indices of nonabsorbing media over a broad spectral range from 0.5 to 5 mum. White-light interferometry based on a double-interferometer system consisting of a fixed Mach-Zehnder interferometer and a Fourier-transform spectrometer is used for direct measurement of the absolute rotation-dependent phase shift induced by an optical element. Refractive index n(lambda) over the whole investigated spectral range is thus obtained directly to an accuracy of 10(-4) without the need for any specific assumption about dispersion. Results for synthetic fused silica are presented and discussed. (C) 2003 Optical Society of America.

引用

页码：3910 / 3914

页数：5

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