Thickness and strain effects on electronic structures of transition metal dichalcogenides: 2H-M X2 semiconductors (M = Mo, W; X = S, Se, Te)

被引:1180
作者
Yun, Won Seok [1 ,2 ,3 ]
Han, S. W. [1 ,2 ]
Hong, Soon Cheol [1 ,2 ]
Kim, In Gee [3 ]
Lee, J. D. [4 ,5 ]
机构
[1] Univ Ulsan, Dept Phys, Ulsan 680749, South Korea
[2] Univ Ulsan, Energy Harvest Storage Res Ctr, Ulsan 680749, South Korea
[3] Pohang Univ Sci & Technol, Grad Inst Ferrous Technol, Pohang 790784, South Korea
[4] Japan Adv Inst Sci & Technol, Sch Mat Sci, Nomi, Ishikawa 9231292, Japan
[5] Japan Adv Inst Sci & Technol, Res Ctr Integrated Sci, Nomi, Ishikawa 9231292, Japan
基金
新加坡国家研究基金会;
关键词
D O I
10.1103/PhysRevB.85.033305
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Using the first-principles calculations, we explore the electronic structures of 2H-M X-2 (M = Mo, W; X = S, Se, Te). When the number of layers reduces to a single layer, the indirect gap of bulk becomes a direct gap with larger gap and the band curvatures are found to lead to the drastic changes of effective masses. On the other hand, when the strain is applied on the single layer, the direct gap becomes an indirect gap and the effective masses vary. Especially, the tensile strain reduces the gap energy and effective masses while the compressive strain enhances them. Furthermore, the much larger tensile stress leads to become
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页数:5
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共 32 条
[1]  
Al-Hilli A. A., 1972, Journal of Crystal Growth, V15, P93, DOI 10.1016/0022-0248(72)90129-7
[2]   Density-functional-theory calculations of electronic band structure of single-crystal and single-layer WS2 -: art. no. 073413 [J].
Albe, K ;
Klein, A .
PHYSICAL REVIEW B, 2002, 66 (07) :1-3
[3]   Realization and electrical characterization of ultrathin crystals of layered transition-metal dichalcogenides [J].
Ayari, Anthony ;
Cobas, Enrique ;
Ogundadegbe, Ololade ;
Fuhrer, Michael S. .
JOURNAL OF APPLIED PHYSICS, 2007, 101 (01)
[4]   First principles study of structural, vibrational and electronic properties of graphene-like MX2 (M=Mo, Nb, W, Ta; X=S, Se, Te) monolayers [J].
Ding, Yi ;
Wang, Yanli ;
Ni, Jun ;
Shi, Lin ;
Shi, Siqi ;
Tang, Weihua .
PHYSICA B-CONDENSED MATTER, 2011, 406 (11) :2254-2260
[5]   MOBILITY OF CHARGE CARRIERS IN SEMICONDUCTING LAYER STRUCTURES [J].
FIVAZ, R ;
MOOSER, E .
PHYSICAL REVIEW, 1967, 163 (03) :743-&
[6]   Band-gap transition induced by interlayer van der Waals interaction in MoS2 [J].
Han, S. W. ;
Kwon, Hyuksang ;
Kim, Seong Keun ;
Ryu, Sunmin ;
Yun, Won Seok ;
Kim, D. H. ;
Hwang, J. H. ;
Kang, J. -S. ;
Baik, J. ;
Shin, H. J. ;
Hong, S. C. .
PHYSICAL REVIEW B, 2011, 84 (04)
[7]   Enhancement of carrier mobility in semiconductor nanostructures by dielectric engineering [J].
Jena, Debdeep ;
Konar, Aniruddha .
PHYSICAL REVIEW LETTERS, 2007, 98 (13)
[8]  
Kittel C., 2005, INTRO SOLID STATE PH, P206
[9]  
Kleinman A, 2001, PSYCHIATRY, V64, P14, DOI 10.1103/PhysRevB.64.205416
[10]   Low-temperature photocarrier dynamics in monolayer MoS2 [J].
Korn, T. ;
Heydrich, S. ;
Hirmer, M. ;
Schmutzler, J. ;
Schueller, C. .
APPLIED PHYSICS LETTERS, 2011, 99 (10)