Scanning force microscopy characterization of individual carbon nanotubes on electrode arrays

被引:66
作者
Muster, J
Burghard, M
Roth, S
Duesberg, GS
Hernandez, E
Rubio, A
机构
[1] Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany
[2] Univ Dublin Trinity Coll, Dept Phys, Dublin 2, Ireland
[3] Univ Valladolid, Dept Fis Teor, Toyoake, Aichi 47011, Japan
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1998年 / 16卷 / 05期
关键词
D O I
10.1116/1.590274
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report the controlled adsorption of individual multi- and single-walled carbon nanotubes from purified aqueous dispersions onto chemically modified silicon oxide surfaces as well as on predefined electrode patterns (100 nm electrode separation). Detailed structural investigations were performed using scanning force microscopy (SFM) without interference from other carbon materials. These studies revealed the striking flexibility of single-walled nanotubes. In contrast to comparably stiff multi-walled nanotubes (MWNTs) which bridged the electrode lines, single-walled nanotubes (SWNTs) were found to follow the profile of the underlying electrodes almost exactly. Based upon the SFM cross sectional analysis of an individual MWNT (8 nm diameter) a Young modulus of about 1 TPa was estimated. Furthermore, nanotube adsorption from the surfactant-stabilized dispersions led to flow-induced orientation processes. (C) 1998 American Vacuum Society. [S0734-211X(98)00605-2].
引用
收藏
页码:2796 / 2801
页数:6
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