Multitip scanning bio-Kelvin probe

被引:68
作者
Baikie, ID [1 ]
Smith, PJS [1 ]
Porterfield, DM [1 ]
Estrup, PJ [1 ]
机构
[1] Marine Biol Lab, Biocurrents Res Ctr, Woods Hole, MA 02543 USA
关键词
D O I
10.1063/1.1149678
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We have developed a novel multitip scanning Kelvin probe which can measure changes in biological surface potential Delta V-s to within 2 mV and, quasisimultaneously monitor displacement to 1 mm. The control and measurement subcomponents are PC based and incorporate a flexible user interface permitting software control of each individual tip, measurement, and scan parameters. We review the mode of operation and design features of the scanning bio-Kelvin probe including tip steering, signal processing, tip calibration, and novel tip tracking/dithering routines. This system uniquely offers both tip-to-sample spacing control (which is essential to avoid spurious changes in Delta V-s due to variations in mean spacing) and a dithering routine to maintain tip orientation to the biological specimen, irrespective of the latter's movement. These features permit long term (>.48 h) "active'' tracking of the displacement and biopotentials developed along and around a plant shoot in response to an environmental stimulus, e.g., differential illumination (phototropism) or changes in orientation (gravitropism). (C) 1999 American Institute of Physics. [S0034-6748(99)04703-6].
引用
收藏
页码:1842 / 1850
页数:9
相关论文
共 61 条
[11]  
BAIKIE ID, IN PRESS SURF SCI
[12]  
BAIKIE ID, UNPUB
[13]  
BAIKIE ID, 1988, THESIS U TWENTE
[14]   MICRO KELVIN PROBE FOR LOCAL WORK-FUNCTION MEASUREMENTS [J].
BAUMGARTNER, H ;
LIESS, HD .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (05) :802-805
[15]   PIEZOELECTRIC DRIVEN KELVIN PROBE FOR CONTACT POTENTIAL DIFFERENCE STUDIES [J].
BESOCKE, K ;
BERGER, S .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1976, 47 (07) :840-842
[16]  
Bruggink G. H., 1994, Proceedings of the Second International Symposium on Ultra-Clean Processing of Silicon Surfaces (UCPSS '94), P193
[17]  
Craig P. P., 1970, Review of Scientific Instruments, V41, P258, DOI 10.1063/1.1684484
[18]   DIRECT OBSERVATION OF STRESS-INDUCED SHIFTS IN CONTACT POTENTIALS [J].
CRAIG, PP .
PHYSICAL REVIEW LETTERS, 1969, 22 (14) :700-&
[19]   EFFECTS OF STRAY CAPACITANCE ON KELVIN METHOD FOR MEASURING CONTACT POTENTIAL DIFFERENCE [J].
DARCY, RJ ;
SURPLICE, NA .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1970, 3 (04) :482-&
[20]   Of a nanoscale Kelvin probe for detecting wear precursors [J].
DeVecchio, D ;
Bhushan, B .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (10) :3618-3624