Fundamentals of high-energy electron-irradiation-induced modifications of silicate glasses

被引:52
作者
Jiang, N [1 ]
Qiu, JR
Ellison, A
Silcox, J
机构
[1] Arizona State Univ, Dept Phys & Astron, Tempe, AZ 85287 USA
[2] Cornell Univ, Sch Appl & Engn Phys, Ithaca, NY 14853 USA
[3] Cornell Univ, Cornell Ctr Mat Res, Ithaca, NY 14853 USA
[4] JST, Photoncraft Project, Seika, Kyoto 6190237, Japan
[5] Corning Inc, Corning, NY 14831 USA
关键词
D O I
10.1103/PhysRevB.68.064207
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report in situ observations of modifications in silicate glasses using electron-energy-loss spectrometry with a small-probe (2.2 Angstrom) scanning transmission electron microscope. Two silicate glasses CaO-Al2O3-SiO2 and ZnO-B2O3-SiO2 are examined. It is found that the nonbridging oxygen (NBO) in glasses plays a critical role in irradiation phenomena. We suggest that a highly localized density of states on the NBO's probably results in a very high sensitivity to electron irradiation of the cations bound to NBO's. These irradiation phenomena noted above reflect a tendency of electron irradiation to eliminate NBO's in the irradiated region.
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页数:11
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共 74 条
[1]   Electron-stimulated desorption of sodium atoms from an oxidized molybdenum surface [J].
Ageev, VN ;
Kuznetsov, YA ;
Madey, TE .
PHYSICAL REVIEW B, 1998, 58 (04) :2248-2252
[2]   ABSENCE OF DIFFUSION IN CERTAIN RANDOM LATTICES [J].
ANDERSON, PW .
PHYSICAL REVIEW, 1958, 109 (05) :1492-1505
[3]   GASEOUS SPECIES AND THEIR PHOTOCHEMICAL-REACTION IN SIO2 [J].
AWAZU, K ;
KAWAZOE, H .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1994, 179 :214-225
[4]   CORE EXCITONS AND INNER WELL RESONANCES IN SURFACE SOFT-X-RAY ABSORPTION (SSXA) SPECTRA [J].
BIANCONI, A .
SURFACE SCIENCE, 1979, 89 (1-3) :41-50
[5]   ELECTRON-BEAM REDUCTION OF SODIUM-CONTAINING GLASS SURFACES [J].
BROW, RK .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1994, 175 (2-3) :155-159
[6]   ION-BEAM EFFECTS ON THE COMPOSITION AND STRUCTURE OF GLASS SURFACES [J].
BROW, RK .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (03) :1673-1676
[7]  
BRUCKNER R, 1976, GLASTECH BER, V49, P211
[8]  
Bruckner R., 1978, GLASTECH BER, V51, P1
[9]  
Carlson T. A, 1975, Photoelectron and Auger Spectroscopy
[10]   CORRELATIONS BETWEEN IONIZATION RADIATION-DAMAGE AND CHARGING EFFECTS IN TRANSMISSION ELECTRON-MICROSCOPY [J].
CAZAUX, J .
ULTRAMICROSCOPY, 1995, 60 (03) :411-425