Fundamentals of high-energy electron-irradiation-induced modifications of silicate glasses

被引：52

作者：

Jiang, N ^{[1
]}

Qiu, JR

Ellison, A

Silcox, J

机构：

[1] Arizona State Univ, Dept Phys & Astron, Tempe, AZ 85287 USA

[2] Cornell Univ, Sch Appl & Engn Phys, Ithaca, NY 14853 USA

[3] Cornell Univ, Cornell Ctr Mat Res, Ithaca, NY 14853 USA

[4] JST, Photoncraft Project, Seika, Kyoto 6190237, Japan

[5] Corning Inc, Corning, NY 14831 USA

来源：

PHYSICAL REVIEW B | 2003年 / 68卷 / 06期

关键词：

D O I：

10.1103/PhysRevB.68.064207

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We report in situ observations of modifications in silicate glasses using electron-energy-loss spectrometry with a small-probe (2.2 Angstrom) scanning transmission electron microscope. Two silicate glasses CaO-Al2O3-SiO2 and ZnO-B2O3-SiO2 are examined. It is found that the nonbridging oxygen (NBO) in glasses plays a critical role in irradiation phenomena. We suggest that a highly localized density of states on the NBO's probably results in a very high sensitivity to electron irradiation of the cations bound to NBO's. These irradiation phenomena noted above reflect a tendency of electron irradiation to eliminate NBO's in the irradiated region.

引用

页数：11

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