Evolution of Ge islands on Si(001) during annealing

被引:244
作者
Kamins, TI [1 ]
Medeiros-Ribeiro, G [1 ]
Ohlberg, DAA [1 ]
Williams, RS [1 ]
机构
[1] Hewlett Packard Labs, Quantum Struct Res Initiat, Palo Alto, CA 94303 USA
关键词
D O I
10.1063/1.369255
中图分类号
O59 [应用物理学];
学科分类号
摘要
The evolution of the shape and size distributions of Ge islands on Si(001) during annealing after deposition has been studied at different temperatures and effective coverages. The initial distributions of square-based pyramids, elongated "hut'' structures, faceted "dome- shaped'' islands, and much larger "superdomes'' depends on the deposition conditions. During annealing after deposition, the islands coarsen over a limited range of times and temperatures. Those pyramidal-shaped islands that grow transform to faceted, dome-shaped islands as they become larger. Initially dome-shaped islands that dissolve transform to a pyramidal shape as they become smaller during the process of dissolving. Outside of this coarsening regime, the islands can achieve a relatively stable, steady-state configuration, especially at lower temperatures. At higher temperatures, intermixing of Si into the Ge islands dominates, decreasing the strain energy and allowing larger islands to form. At lower and intermediate temperatures, the initial wetting layer is metastable, and some Ge transfers to the islands during the early stages of annealing. (C) 1999 American Institute of Physics. [S0021-8979(99)02702-4].
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收藏
页码:1159 / 1171
页数:13
相关论文
共 34 条
[1]   Atomic force microscopy study of self-organized Ge islands grown on Si(100) by low pressure chemical vapor deposition [J].
Capellini, G ;
DiGaspare, L ;
Evangelisti, F ;
Palange, E .
APPLIED PHYSICS LETTERS, 1997, 70 (04) :493-495
[2]  
CHAKRAVE.BK, 1967, J PHYS CHEM SOLIDS, V28, P2401, DOI 10.1016/0022-3697(67)90026-1
[4]   Structural transition in large-lattice-mismatch heteroepitaxy [J].
Chen, Y ;
Washburn, J .
PHYSICAL REVIEW LETTERS, 1996, 77 (19) :4046-4049
[5]   DIFFUSION IN STRAINED SI(GE) [J].
COWERN, NEB ;
ZALM, PC ;
VANDERSLUIS, P ;
GRAVESTEIJN, DJ ;
DEBOER, WB .
PHYSICAL REVIEW LETTERS, 1994, 72 (16) :2585-2588
[6]   COHERENT ISLANDS AND MICROSTRUCTURAL EVOLUTION [J].
DRUCKER, J .
PHYSICAL REVIEW B, 1993, 48 (24) :18203-18206
[7]   DISLOCATION-FREE STRANSKI-KRASTANOW GROWTH OF GE ON SI(100) [J].
EAGLESHAM, DJ ;
CERULLO, M .
PHYSICAL REVIEW LETTERS, 1990, 64 (16) :1943-1946
[8]  
Gibbs J.W., 1876, Am.J. Sci, V3, P108, DOI DOI 10.2475/AJS.S3-16.96.441
[9]   Competing growth mechanisms of Ge/Si(001) coherent clusters [J].
Goldfarb, I ;
Hayden, PT ;
Owen, JHG ;
Briggs, GAD .
PHYSICAL REVIEW B, 1997, 56 (16) :10459-10468
[10]   Kinetic pathways to strain relaxation in the Si-Ge system [J].
Jesson, DE ;
Chen, KM ;
Pennycook, SJ .
MRS BULLETIN, 1996, 21 (04) :31-37