Effects of excitation density on cathodoluminescence from GaN

被引:41
作者
Kucheyev, SO [1 ]
Toth, M
Phillips, MR
Williams, JS
Jagadish, C
机构
[1] Australian Natl Univ, Res Sch Phys Sci & Engn, Dept Elect Mat Engn, Canberra, ACT 0200, Australia
[2] Univ Technol Sydney, Microstruct Anal Unit, Broadway, NSW 2007, Australia
关键词
D O I
10.1063/1.1408273
中图分类号
O59 [应用物理学];
学科分类号
摘要
Wurtzite GaN epilayers are studied by cathodoluminescence (CL) spectroscopy. Results show that the intensities of donor-acceptor pair (DAP) and yellow luminescence (YL) peaks sublinearly depend on excitation density, presumably, due to saturation effects. The intensity of near-gap emission, however, exhibits a superlinear dependence on electron-beam excitation. In contrast to photoluminescence measurements, CL studies of GaN are usually performed in a regime with a strongly nonlinear dependence of luminescence intensities on excitation due to a large difference in carrier generation rates for these two techniques. As a result, the ratios of near-gap to YL and DAP emission intensities strongly depend on electron-beam current. Moreover, electron-beam spot size (i.e., beam focusing) dramatically affects CL intensity. An understanding of such saturation effects is necessary for a correct interpretation of CL spectra from GaN. (C) 2001 American Institute of Physics.
引用
收藏
页码:2154 / 2156
页数:3
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