Ultrahigh Strain Hardening in Thin Palladium Films with Nanoscale Twins

被引：76

作者：

Idrissi, Hosni ^{[1
]}

Wang, Binjie ^{[1
]}

Colla, Marie Stephane ^{[2
]}

Raskin, Jean Pierre ^{[3
,4
]}

Schryvers, Dominique ^{[1
]}

Pardoen, Thomas ^{[2
,4
]}

机构：

[1] Univ Antwerp, EMAT, B-2020 Antwerp, Belgium

[2] Catholic Univ Louvain, Inst Mech Mat & Civil Engn, B-1348 Louvain, Belgium

[3] Catholic Univ Louvain, Dept Elect Engn, B-1348 Louvain, Belgium

[4] Catholic Univ Louvain, CeRMiN, Res Ctr Micro & Nanoscop Mat & Elect Devices, B-1348 Louvain, Belgium

来源：

ADVANCED MATERIALS | 2011年 / 23卷 / 18期

关键词：

FCC METALS; MAXIMUM STRENGTH; GRAIN STABILITY; DUCTILITY; ALUMINUM; DEFORMATION; MECHANISMS; BOUNDARIES; COPPER;

D O I：

10.1002/adma.201004160

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Nanocrystalline Pd thin films containing coherent growth twin boundaries are deformed using on-chip nanomechanical testing. A large work-hardening capacity is measured. The origin of the observed behavior is unraveled using transmission electron microscopy and shows specific dislocations and twin boundaries interactions. The results indicate the potential for large strength and ductility balance enhancement in Pd films, as needed in membranes for H technologies.

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页码：2119 / +

页数：5

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