Energy resolution in GaAs X- and γ-ray detectors

被引:26
作者
Bertuccio, G
Canali, C
Nava, F
机构
[1] Politecn Milan, Dipartimento Elettr & Informat, I-20133 Milan, Italy
[2] Ist Nazl Fis Nucl, Sez Milano, Milan, Italy
[3] Univ Modena, Dipartimento Sci Ingn, I-41100 Modena, Italy
[4] Ist Nazl Fis Nucl, Sez Bologna, Bologna, Italy
[5] Univ Modena, Dipartimento Fis, I-41100 Modena, Italy
关键词
D O I
10.1016/S0168-9002(98)00138-7
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The present limits of the energy resolution achievable using GaAs detectors are analysed and discussed. The noise due to the reverse current and the noise due to the charge-carrier trapping have been considered, giving upper limits to attain specific energy resolutions. The degradation of the resolution due to charge trapping is examined. It is shown that, in general, a charge collection efficiency higher than 98% is required to reduce the influence of the trapping in high-resolution X-and gamma-ray spectroscopy with GaAs detectors. (C) 1998 Published by Elsevier Science B.V. All rights reserved.
引用
收藏
页码:29 / 35
页数:7
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