Low Schottky barriers on n-type silicon(001)

被引:58
作者
Tao, M [1 ]
Agarwal, S
Udeshi, D
Basit, N
Maldonado, E
Kirk, WP
机构
[1] Univ Texas, Dept Elect Engn, Arlington, TX 76019 USA
[2] Univ Texas, NanoFAB Ctr, Arlington, TX 76019 USA
关键词
D O I
10.1063/1.1613357
中图分类号
O59 [应用物理学];
学科分类号
摘要
It has been reported that no metal shows a Schottky barrier of less than 0.4 eV on n-type silicon (001). This is attributed to interface states between metal and silicon (001), which pin the interface Fermi level and make the Schottky barrier more or less independent of the metal work function. We demonstrate that, by terminating dangling bonds and relaxing strained bonds on the silicon (001) surface with a monolayer of selenium, low Schottky barriers can be obtained on n-type silicon (001). Aluminum and chromium show barrier heights of 0.08 and 0.26 eV on n-type silicon (001), respectively. These results agree well with the ideal Schottky barrier heights for aluminum and chromium on n-type silicon (001), but are significantly different from the experimental barrier heights known for four decades for these metals on n-type silicon (001). (C) 2003 American Institute of Physics.
引用
收藏
页码:2593 / 2595
页数:3
相关论文
共 7 条
[1]   SURFACE STATES AND BARRIER HEIGHT OF METAL-SEMICONDUCTOR SYSTEMS [J].
COWLEY, AM ;
SZE, SM .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (10) :3212-&
[2]   THEORY OF SURFACE STATES [J].
HEINE, V .
PHYSICAL REVIEW, 1965, 138 (6A) :1689-&
[3]   WORK FUNCTION OF ELEMENTS AND ITS PERIODICITY [J].
MICHAELSON, HB .
JOURNAL OF APPLIED PHYSICS, 1977, 48 (11) :4729-4733
[4]   Adsorption and desorption of Se on Si(100) 2 x 1: surface restoration [J].
Papageorgopoulos, AC ;
Kamaratos, M .
SURFACE SCIENCE, 2000, 466 (1-3) :173-182
[5]  
SZE SM, 1981, PHYSICS SEMICONDUCTO
[6]   Removal of dangling bonds and surface states on silicon(001) with a monolayer of selenium [J].
Tao, M ;
Udeshi, D ;
Basit, N ;
Maldonado, E ;
Kirk, WP .
APPLIED PHYSICS LETTERS, 2003, 82 (10) :1559-1561
[7]   SI(001) DIMER STRUCTURE OBSERVED WITH SCANNING TUNNELING MICROSCOPY [J].
TROMP, RM ;
HAMERS, RJ ;
DEMUTH, JE .
PHYSICAL REVIEW LETTERS, 1985, 55 (12) :1303-1306