SURFACE STATES AND BARRIER HEIGHT OF METAL-SEMICONDUCTOR SYSTEMS

被引：1180

作者：

COWLEY, AM

SZE, SM

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1965年 / 36卷 / 10期

关键词：

D O I：

10.1063/1.1702952

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：3212 / &

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[9] ATTENUATION LENGTH MEASUREMENTS OF HOT ELECTRONS IN METAL FILMS
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