Adsorption and desorption of Se on Si(100) 2 x 1: surface restoration

被引:26
作者
Papageorgopoulos, AC [1 ]
Kamaratos, M [1 ]
机构
[1] Univ Ioannina, Dept Phys, GR-45110 Ioannina, Greece
关键词
auger electron spectroscopy; diffusion and migration; low energy electron diffraction (LEED); silicon; surface relaxation and reconstruction; thermal desorption spectroscopy; work function measurements;
D O I
10.1016/S0039-6028(00)00759-7
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
This work entails a study of the adsorption of elemental Se on the reconstructed Si(100)2 x 1 surface. The investigation took place in an ultra high vacuum (UHV) by low energy electron diffraction (LEED), Auger electron spectroscopy (AES), thermal desorption spectroscopy (TDS) and work function (WF) measurements. The adsorption of one monolayer (1 ML) of Se at room temperature (RT) causes the transition of the reconstructed Si(100)2 x 1 surface to its original bulk terminated Si(100)1 x 1 configuration, while Se adatoms form a 1 x 1 structure by breaking the Si-Si dimer bonds,The Si-Se bond is strong (E-b = 2.97 eV/atom), resulting in the formation of a SiSe compound. Above 1 ML, Se forms a SiSe, compound with E-b = 2.67 eV/atom. The heating that follows causes the desorption of Se up until 1000 K, where Theta (Se) = 0.5 ML, and the Si(100)1 x 1 structure is changed back to the reconstructed Si(100)2 x 1 with the Se forming a 2 x 1 structure. The models of Se(1 x 1)/Si(100)1 x 1 and of the Se(2 x 1)/Si(100)2 x 1 structures are given. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:173 / 182
页数:10
相关论文
共 29 条
[1]   ADSORBED LAYER AND THIN-FILM GROWTH MODES MONITORED BY AUGER-ELECTRON SPECTROSCOPY [J].
ARGILE, C ;
RHEAD, GE .
SURFACE SCIENCE REPORTS, 1989, 10 (6-7) :277-356
[2]   Photoemission studies of the interactions of CdTe and Te with Si(100) [J].
Bennett, MR ;
Cafolla, AA ;
Cairns, JW ;
Dunscombe, CJ ;
Williams, RH .
SURFACE SCIENCE, 1996, 360 (1-3) :187-199
[3]   BONDING OF SE AND ZNSE TO THE SI(100) SURFACE [J].
BRINGANS, RD ;
OLMSTEAD, MA .
PHYSICAL REVIEW B, 1989, 39 (17) :12985-12988
[4]   Adsorption and desorption of S on and off Si(001) studied by ab initio density functional theory [J].
Cakmak, M ;
Srivastava, GP .
JOURNAL OF APPLIED PHYSICS, 1998, 84 (11) :6070-6075
[5]   ELECTRON-SPECTROSCOPY INVESTIGATION OF TE THIN-FILMS DEPOSITED AT ROOM-TEMPERATURE ON SI(100)2X1 [J].
DINARDO, S ;
LOZZI, L ;
PASSACANTANDO, M ;
PICOZZI, P ;
SANTUCCI, S .
SURFACE SCIENCE, 1995, 331 :569-574
[6]   Etching and a disordered overlayer on the Ge(100)-S surface [J].
Gothelid, M ;
LeLay, G ;
Wigren, C ;
Bjorkqvist, M ;
Rad, M ;
Karlsson, UO .
APPLIED SURFACE SCIENCE, 1997, 115 (01) :87-95
[7]   SULFUR AS A SURFACE PASSIVATION FOR INP [J].
IYER, R ;
CHANG, RR ;
LILE, DL .
APPLIED PHYSICS LETTERS, 1988, 53 (02) :134-136
[8]  
JAIN RK, 1991, 22 IEEE PHOT SPEC C
[9]   ABINITION CALCULATIONS OF SI, AS, S, SE, AND CL ADSORPTION ON SI(001) SURFACES [J].
KRUGER, P ;
POLLMANN, J .
PHYSICAL REVIEW B, 1993, 47 (04) :1898-1910
[10]   PHOTOLUMINESCENCE STUDY OF SULFIDE LAYERS ON P-TYPE INP [J].
LEONELLI, R ;
SUNDARARAMAN, CS ;
CURRIE, JF .
APPLIED PHYSICS LETTERS, 1990, 57 (25) :2678-2679