共 11 条
[2]
CORRELATION BETWEEN OPTICAL AND TOPOGRAPHICAL IMAGES FROM AN EXTERNAL REFLECTION NEAR-FIELD MICROSCOPE WITH SHEAR FORCE FEEDBACK
[J].
APPLIED OPTICS,
1995, 34 (19)
:3793-3799
[3]
Near-field phase measurement by Fourier analysis of the fringe pattern
[J].
PURE AND APPLIED OPTICS,
1997, 6 (05)
:491-502
[7]
Gregor MJ, 1996, APPL PHYS LETT, V68, P307, DOI 10.1063/1.116068