Visible photoluminescence from a-Si:H/SiO2 superlattices fabricated by UHV evaporation

被引:8
作者
Nishimoto, K
Sotta, D
Durand, HA
Etoh, K
Ito, K
机构
[1] Japan Aviat Elect Ind Ltd, Cent Res Lab, Akishima, Tokyo 1968555, Japan
[2] Univ Louis Pasteur Strasbourg 1, Ecole Natl Super Phys Strasbourg, Illkirch Graffenstaden, France
关键词
superlattice; hydrogenated amorphous Si; UHV evaporation;
D O I
10.1016/S0022-2313(98)00144-6
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Hydrogenated amorphous-Si/SiO2 (a-Si:H/SiO2) superlattices with different a-Si:H thickness in the range of a few nanometers have been fabricated by ultra high vacuum evaporator (UHV evaporator). The photoluminescence (PL) of our superlattices is observed in the visible spectral region and the peak energy shifts to higher energy as the a-Si: H layer thickness decreases. The temperature dependence of the PL spectra reveals four sub-bands by fitting. Bands at 2.2, 1.9, 1.65 and 1.45 eV are detected and are attributed to E 'delta centers, nonbridging-oxygen-hole centers (NBOHC), Si/SiO2 interface and a-Si:H layer, respectively. We explain the overall blueshift of the PL spectra by the modification of the contribution of these sub-bands. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:439 / 444
页数:6
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