In situ field emission of density-controlled ZnO nanowire arrays

被引:240
作者
Wang, Xudong
Zhou, Jun
Lao, Changshi
Song, Jinhui
Xu, Ningsheng
Wang, Zhong L. [1 ]
机构
[1] Georgia Inst Technol, Sch Mat Sci & Engn, Atlanta, GA 30332 USA
[2] Zhongshan Univ, Sch Phys & Engn, State Key Lab Optoelect Mat & Technol, Guangzhou 510275, Peoples R China
关键词
D O I
10.1002/adma.200602467
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
An effective in situ field-emission measurement system, in which the distance between the emitting source and counter electrode can be accurately measured and finely controlled by setting up a second stage inside a scanning electron microscopy chamber, is developed. It is found that nanowires with a density between 60 and 80 mu m(-2) (see figure) and of ca. 1 mu m in length give the highest emitting current density.
引用
收藏
页码:1627 / +
页数:6
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