Measuring thermal and thermoelectric properties of one-dimensional nanostructures using a microfabricated device

被引：613

作者：

Shi, L ^{[1
]}

Li, DY

Yu, CH

Jang, WY

Kim, D

Yao, Z

Kim, P

Majumdar, A

机构：

[1] Univ Texas, Ctr Nano & Mol Sci & Technol, Dept Mech Engn, Austin, TX 78712 USA

[2] Univ Calif Berkeley, Dept Mech Engn, Dept Phys, Berkeley, CA 94720 USA

[3] Columbia Univ, Dept Phys, New York, NY 10027 USA

[4] Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Dept Mech Engn, Div Sci Mat, Berkeley, CA 94720 USA

来源：

JOURNAL OF HEAT TRANSFER-TRANSACTIONS OF THE ASME | 2003年 / 125卷 / 05期

关键词：

heat transfer; measurement techniques; microscale; nanoscale; thermoelectric;

D O I：

10.1115/1.1597619

中图分类号：

O414.1 [热力学];

学科分类号：

摘要：

We have batch-fabricated a microdevice consisting of two adjacent symmetric silicon nitride membranes suspended by long silicon nitride beams for measuring thermophysical properties of one-dimensional nanostructures (nanotubes, nanowires, and nanobelts) bridging the two membranes. A platinum resistance heater/thermometer is fabricated on each membrane. One membrane can be Joule heated to cause heat conduction through the sample to the other membrane. Thermal conductance, electrical conductance, and Seebeck coefficient can be measured using this microdevice in the temperature range of 4-400 K of an evacuated Helium cryostat. Measurement sensitivity, errors, and uncertainty are discussed. Measurement results of a 148 nm and a 10 nm-diameter single wall carbon nanotube bundle (ire presented.

引用

页码：881 / 888

页数：8

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