Strong tip effects in near-field scanning optical tomography

被引：33

作者：

Sun, Jin ^{[1
]}

Carney, P. Scott

Schotland, John C.

机构：

[1] Univ Illinois, Dept Elect & Comp Engn, Coordinated Sci Lab, Urbana, IL 61801 USA

[2] Univ Penn, Dept Bioengn, Philadelphia, PA 19104 USA

来源：

JOURNAL OF APPLIED PHYSICS | 2007年 / 102卷 / 10期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1063/1.2812545

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A model for the interaction of the scanning probe in near-field scanning optical microscopy is presented. Multiple scattering of the illuminating field with the probe is taken into account. The implications of this so-called strong tip model for the solution of the associated inverse scattering problem are studied through simulations. (c) 2007 American Institute of Physics.

引用

页数：9

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