Theory of total-internal-reflection tomography

被引：28

作者：

Carney, PS

Schotland, JC

机构：

[1] Univ Illinois, Dept Elect & Comp Engn, Urbana, IL 61821 USA

[2] Washington Univ, Dept Elect Engn, St Louis, MO 63130 USA

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 2003年 / 20卷 / 03期

关键词：

D O I：

10.1364/JOSAA.20.000542

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A method is presented to reconstruct three-dimensional tomographic images of weakly scattering objects with subwavelength resolution. The method may be applied to data available in phase-sensitive, total-internal-reflection microscopy. The results follow from an analysis of the near-field inverse scattering problem with evanescent waves. (C) 2003 Optical Society of America.

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收藏

页码：542 / 547

页数：6

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