Characterization of triazine derivatives on silicon wafers studied by photoelectron spectroscopy (XPS, UPS) and metastable impact electron spectroscopy (MIES)

被引：25

作者：

Dieckhoff, S ^{[1
]}

Schlett, V ^{[1
]}

Possart, W ^{[1
]}

Hennemann, OD ^{[1
]}

Gunster, J ^{[1
]}

Kempter, V ^{[1
]}

机构：

[1] TECH UNIV CLAUSTHAL,INST PHYS,D-38678 CLAUSTHAL ZELLERF,GERMANY

来源：

APPLIED SURFACE SCIENCE | 1996年 / 103卷 / 03期

关键词：

D O I：

10.1016/0169-4332(96)00567-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Thin films of a diandicyanato bisphenol A (DCBA) prepolymer and thin layers of the trimer of the 2,4,6-tris-(p-cumylphenylcyanate)-1,3,5-triazine (p-CPC trimer), both deposited on silicon wafers covered by their native oxide, have been investigated by X-ray photoelectron spectroscopy (XPS), Ultraviolet photoelectron spectroscopy (UPS) and metastable impact electron spectroscopy (MIES). MIES as well as angle dependent XPS indicate a preferential orientation of the molecules of the first adlayer on the surface. The adsorption of the first layer is governed by the interaction of the trioxytriazine rings with the substrate surface. This adsorption model is supported by the calculated conformation of the DCBA and p-CPC trimer.

引用

页码：221 / 229

页数：9

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