AFM INVESTIGATIONS OF THE INITIAL-STAGES OF PREPOLYMER FILM GROWTH ON ALUMINUM

被引：8

作者：

GESANG, T

HOPER, R

DIECKHOFF, S

FANTER, D

HARTWIG, A

POSSART, W

HENNEMANN, OD

机构：

[1] Fraunhofer-Institut für Angewandte Materialforschung, D-28719 Bremen

来源：

APPLIED SURFACE SCIENCE | 1995年 / 84卷 / 03期

关键词：

D O I：

10.1016/0169-4332(94)00546-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

A cyanurate prepolymer was applied to aluminium-coated silicon wafers by adsorption out of solution. Film growth from the initial stages to closed films was studied by Atomic Force Microscopy. Sample preparation in the presence of external forces (spin coating) leads to film morphologies very different from adsorption near equilibrium (dip coating). The edge of the non-closed films can be characterized by means of a borderline angle. The influence of specific prepolymer-substrate interactions, external forces and substrate topography is discussed.

引用

页码：273 / 283

页数：11

共 14 条

[1] ELLIPSOMETRIC AND X-RAY SPECULAR REFLECTION STUDIES ON NATURALLY GROWN OVERLAYERS ON ALUMINUM THIN-FILMS [J].