Space-variant polarization manipulation for far-field polarimetry by use of subwavelength dielectric gratings

被引：36

作者：

Gorodetski, Y ^{[1
]}

Biener, G ^{[1
]}

Niv, A ^{[1
]}

Kleiner, V ^{[1
]}

Hasman, E ^{[1
]}

机构：

[1] Technion Israel Inst Technol, Fac Mech Engn, Opt Engn Lab, IL-32000 Haifa, Israel

来源：

OPTICS LETTERS | 2005年 / 30卷 / 17期

关键词：

D O I：

10.1364/OL.30.002245

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A method for polarimetric measurement that uses a discrete space-variant subwavelength dielectric grating is presented. One retrieves the polarization state by measuring the far-field intensity of a beam emerging from the grating followed by a polarizer. The analysis for a partially polarized, quasi-monochromatic beam is performed by use of the beam coherence polarization matrix along with an extended van Cittert-Zernike theorem. We experimentally demonstrate polarization measurements of both fully and partially polarized light. (c) 2005 Optical Society of America.

引用

页码：2245 / 2247

页数：3

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