Interpretation of long-range interatomic force

被引:10
作者
Buldum, A [1 ]
Ciraci, S
Fong, CY
Nelson, JS
机构
[1] Bilkent Univ, Dept Phys, TR-06533 Bilkent, Ankara, Turkey
[2] Univ Calif Davis, Dept Phys, Davis, CA 95616 USA
[3] Sandia Natl Labs, Semicond Phys Div, Albuquerque, NM 87185 USA
来源
PHYSICAL REVIEW B | 1999年 / 59卷 / 07期
关键词
D O I
10.1103/PhysRevB.59.5120
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Recent direct mechanical measurements of atomic force microscopy showed that the force between the silicon tip and the silicon sample is long range in the attractive region and its magnitude at maximum is relatively smaller. These features disagree with previous theoretical predictions based on the ab initio calculations. We investigated the nature of forces between a silicon tip and the silicon (111)-(2X1) surface by performing first-principles pseudopotential and classical molecular dynamics calculations and by calculating the van der Waals interaction. The first two methods give forces that are short range in nature. Fair agreement between the experiment and theory is obtained when the van der Waals interaction is included. The effect of the tip induced deformation is analyzed. [S0163-1829(99)04504-X].
引用
收藏
页码:5120 / 5125
页数:6
相关论文
共 45 条
[1]   EFFECT OF TIP PROFILE ON ATOMIC-FORCE MICROSCOPE IMAGES - A MODEL STUDY [J].
ABRAHAM, FF ;
BATRA, IP ;
CIRACI, S .
PHYSICAL REVIEW LETTERS, 1988, 60 (13) :1314-1317
[2]   MOLECULAR-DYNAMICS STUDY OF SELF-INTERSTITIALS IN SILICON [J].
BATRA, IP ;
ABRAHAM, FF ;
CIRACI, S .
PHYSICAL REVIEW B, 1987, 35 (18) :9552-9558
[3]  
BATRA IP, 1988, PHYS REV B, V34, P6632
[4]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[5]   Contact, nanoindentation, and sliding friction [J].
Buldum, A ;
Ciraci, S ;
Batra, IP .
PHYSICAL REVIEW B, 1998, 57 (04) :2468-2476
[6]   Interpretation of force curves in force microscopy [J].
Burnham, N.A. ;
Colton, R.J. ;
Pollock, H.M. .
1600, (04)
[7]   GROUND-STATE OF THE ELECTRON-GAS BY A STOCHASTIC METHOD [J].
CEPERLEY, DM ;
ALDER, BJ .
PHYSICAL REVIEW LETTERS, 1980, 45 (07) :566-569
[8]   ATTRACTIVE INTERATOMIC FORCE AS A TUNNELING PHENOMENON [J].
CHEN, CJ .
JOURNAL OF PHYSICS-CONDENSED MATTER, 1991, 3 (10) :1227-1245
[9]   SITE-DEPENDENT ELECTRONIC EFFECTS, FORCES, AND DEFORMATIONS IN SCANNING TUNNELING MICROSCOPY OF FLAT METAL-SURFACES [J].
CIRACI, S ;
BARATOFF, A ;
BATRA, IP .
PHYSICAL REVIEW B, 1990, 42 (12) :7618-7621
[10]   TIP-SAMPLE INTERACTION EFFECTS IN SCANNING-TUNNELING AND ATOMIC-FORCE MICROSCOPY [J].
CIRACI, S ;
BARATOFF, A ;
BATRA, IP .
PHYSICAL REVIEW B, 1990, 41 (05) :2763-2775