Direct oxygen imaging within a ceramic interface, with some observations upon the dark contrast at the grain boundary

被引:33
作者
Findlay, S. D. [1 ]
Azuma, S. [1 ]
Shibata, N. [1 ,2 ]
Okunishi, E. [3 ]
Ikuhara, Y. [1 ,4 ,5 ]
机构
[1] Univ Tokyo, Inst Engn Innovat, Tokyo 1160013, Japan
[2] Japan Sci & Technol Agcy, PRESTO, Kawaguchi, Saitama 3320012, Japan
[3] JEOL Ltd, Tokyo 1968558, Japan
[4] Japan Fine Ceram Ctr, Nanostruct Res Lab, Nagoya, Aichi 4568587, Japan
[5] Tohoku Univ, WPI Adv Inst Mat Res, Sendai, Miyagi 9808577, Japan
基金
日本科学技术振兴机构;
关键词
Scanning transmission electron microscopy (STEM); High-angle annular dark field (HAADF); Annular bright field (ABF); RESOLUTION;
D O I
10.1016/j.ultramic.2010.12.022
中图分类号
TH742 [显微镜];
学科分类号
摘要
Annular bright field scanning transmission electron microscopy, which has recently been established to produce directly interpretable images with both light and heavier atomic columns visible simultaneously, is shown to allow directly interpretable imaging of the oxygen columns within the Sigma 13 [1 (2) over bar 1 0](1 0 (1) over bar 4) pyramidal twin grain boundary in alpha-Al2O3. By using information in the high-angle annular dark field image and annular bright field images simultaneously, we estimate the specimen thickness and finite source size, and use them to explore in simulation the issue of dark contrast in the vicinity of the grain boundary in the annular dark field image. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码:285 / 289
页数:5
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