Robust atomic resolution imaging of light elements using scanning transmission electron microscopy

被引：292

作者：

Findlay, S. D. ^{[1
]}

Shibata, N. ^{[1
,2
]}

Sawada, H. ^{[3
]}

Okunishi, E. ^{[3
]}

Kondo, Y. ^{[3
]}

Yamamoto, T. ^{[1
,4
]}

Ikuhara, Y. ^{[1
,4
,5
]}

机构：

[1] Univ Tokyo, Sch Engn, Inst Engn Innovat, Tokyo 1138656, Japan

[2] Japan Sci & Technol Agcy, PRESTO, Saitama 3320012, Japan

[3] JEOL Ltd, Tokyo 1968558, Japan

[4] Japan Fine Ceram Ctr, Nanostruct Res Lab, Nagoya, Aichi 4568587, Japan

[5] Tohoku Univ, WPI Adv Inst Mat Res, Sendai, Miyagi 9808577, Japan

来源：

APPLIED PHYSICS LETTERS | 2009年 / 95卷 / 19期

基金：

日本科学技术振兴机构; 日本学术振兴会;

关键词：

DIFFRACTION;

D O I：

10.1063/1.3265946

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We show that an annular detector placed within the bright field cone in scanning transmission electron microscopy allows direct imaging of light elements in crystals. In contrast to common high angle annular dark field imaging, both light and heavy atom columns are visible simultaneously. In contrast to common bright field imaging, the images are directly and robustly interpretable over a large range of thicknesses. We demonstrate this through systematic simulations and present a simple physical model to obtain some insight into the scattering dynamics (C) 2009 American Institute of Physics. [doi:10.1063/1.3265946]

引用

页数：3

共 14 条

[1] Limitations on the s-state approach to the interpretation of sub-angstrom resolution electron microscope images and microanalysis [J].

Anstis, GR ;

Cai, DQ ;

Cockayne, DJH .

ULTRAMICROSCOPY, 2003, 94 (3-4) :309-327

[2] Two-dimensional mapping of chemical information at atomic resolution [J].

Bosman, M. ;

Keast, V. J. ;

Garcia-Munoz, J. L. ;

D'Alfonso, A. J. ;

Findlay, S. D. ;

Allen, L. J. .

PHYSICAL REVIEW LETTERS, 2007, 99 (08)

[3] BLOCH WAVES AND THEIR CORRESPONDING ATOMIC AND MOLECULAR-ORBITALS IN HIGH-ENERGY ELECTRON-DIFFRACTION [J].

BUXTON, BF ;

LOVELUCK, JE ;

STEEDS, JW .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1978, 38 (03) :259-278

[4] PHASE RETRIEVAL THROUGH FOCUS VARIATION FOR ULTRA-RESOLUTION IN FIELD-EMISSION TRANSMISSION ELECTRON-MICROSCOPY [J].

COENE, W ;

JANSSEN, G ;

DEBEECK, MO ;

VANDYCK, D .

PHYSICAL REVIEW LETTERS, 1992, 69 (26) :3743-3746

[5] The S-state model for electron channeling in high-resolution electron microscopy [J].

Geuens, P ;

Van Dyck, D .

ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 136, 2005, 136 :111-226

[6] Atomic-scale analysis of the oxygen configuration at a SrTiO3 dislocation core -: art. no. 225506 [J].

Jia, CL ;

Thust, A ;

Urban, K .

PHYSICAL REVIEW LETTERS, 2005, 95 (22)

[7] Atomic-resolution measurement of oxygen concentration in oxide materials [J].

Jia, CL ;

Urban, K .

SCIENCE, 2004, 303 (5666) :2001-2004

[8] Element-selective imaging of atomic columns in a crystal using STEM and EELS [J].

Kimoto, Koji ;

Asaka, Toru ;

Nagai, Takuro ;

Saito, Mitsuhiro ;

Matsui, Yoshio ;

Ishizuka, Kazuo .

NATURE, 2007, 450 (7170) :702-704

[9] Direct determination of local lattice polarity in crystals [J].

Mkhoyan, KA ;

Batson, PE ;

Cha, J ;

Schaff, WJ ;

Silcox, J .

SCIENCE, 2006, 312 (5778) :1354-1354

[10] Atomic-scale chemical imaging of composition and bonding by aberration-corrected microscopy [J].

Muller, D. A. ;

Kourkoutis, L. Fitting ;

Murfitt, M. ;

Song, J. H. ;

Hwang, H. Y. ;

Silcox, J. ;

Dellby, N. ;

Krivanek, O. L. .

SCIENCE, 2008, 319 (5866) :1073-1076

← 1 2 →