Photoemission investigations on nanostructured TiO2 grown by cluster assembling

被引：8

作者：

Caruso, T.

Lenardi, C.

Mazza, T.

Policicchio, A.

Bongiorno, G.

Agostino, R. G.

Chiarello, G.

Colavita, E.

Finetti, P.

Prince, K. C.

Ducati, C.

Piseri, P.

Milani, P.

机构：

[1] Univ Calabria, CNISM, Dipartimento Fis, I-87036 Arcavacata Di Rende, CS, Italy

[2] Ist Fisiol Gen & Chim Biol, I-20133 Milan, Italy

[3] Univ Milan, Dipartimento Fis, I-20133 Milan, Italy

[4] Univ Milan, CIMAINA, I-20133 Milan, Italy

[5] Univ Padua, Dipartimento Sci Chim, I-35131 Padua, Italy

[6] Sincrotrone Trieste, I-34012 Basovizza, Trieste, Italy

[7] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB2 3QZ, England

来源：

SURFACE SCIENCE | 2007年 / 601卷 / 13期

关键词：

titanium oxide; photoelectron spectroscopy; transmission electron microscopy; defects; nanostructures;

D O I：

10.1016/j.susc.2006.12.025

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Nanostructured titanium dioxide (ns-TiO2) films were grown by supersonic cluster beam deposition method. Transmission electron microscopy demonstrated that films are mainly composed by TiO2 nanocrystals embedded in an amorphous TiO2 phase while their electronic structure was studied by photoemission spectroscopy. The cluster assembled ns-TiO2 films are expected to exhibit several structural and chemical defects owing to the large surface to volume ratio of the deposited clusters. Ultraviolet photoemission spectra (hv = 50 eV) from the valence band unveil the presence of a restrained amount of surface Ti 3d defect states in the band gap, whereas Ti 2p core level X-ray photoelectron (hv = 630 eV) spectra do not manifestly disclose these defects. (C) 2006 Elsevier B.V. All rights reserved.

引用

页码：2688 / 2691

页数：4

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