Surface, bulk, and interface electronic properties of nonpolar InN

被引:31
作者
Linhart, W. M. [1 ]
Veal, T. D. [1 ]
King, P. D. C. [1 ]
Koblmueller, G. [2 ,3 ]
Gallinat, C. S. [2 ]
Speck, J. S. [2 ]
McConville, C. F. [1 ]
机构
[1] Univ Warwick, Dept Phys, Coventry CV4 7AL, W Midlands, England
[2] Univ Calif Santa Barbara, Dept Mat, Santa Barbara, CA 93106 USA
[3] Tech Univ Munich, Walter Schottky Inst, D-85748 Garching, Germany
基金
英国工程与自然科学研究理事会;
关键词
electronic density of states; Fermi level; III-V semiconductors; indium compounds; infrared spectra; interface states; reflectivity; semiconductor thin films; space charge; surface states; wide band gap semiconductors; X-ray photoelectron spectra; POLAR; GAN;
D O I
10.1063/1.3488821
中图分类号
O59 [应用物理学];
学科分类号
摘要
The electronic properties of a-plane and m-plane InN have been investigated by x-ray photoemission spectroscopy, infrared reflectivity, and surface space-charge calculations. Electron accumulation has been observed at the surface of nonpolar InN and the surface Fermi level has been found to be lower than previously observed on InN samples. A high electron density in the InN close to the interface with GaN was found in each nonpolar InN sample. (c) 2010 American Institute of Physics. [doi:10.1063/1.3488821]
引用
收藏
页数:3
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