Effects of ultra-high vacuum on crystallographic, recording and magnetic properties of thin film media

被引：11

作者：

Gao, C ^{[1
]}

Wu, S

Chen, JP

Malmhall, R

Habermeier, C

Sinclair, R

Laidler, H

O'Grady, K

机构：

[1] Seagate Recording Media, Fremont, CA 94538 USA

[2] Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USA

[3] Univ Wales, SEECS, Magnet Mat Res Grp, Bangor LL57 1UT, Gwynedd, Wales

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1998年 / 34卷 / 04期

关键词：

thin film media; magnetic properties; sputtering conditions; stacking faults;

D O I：

10.1109/20.706620

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A range of CoCrPt thin film discs sputtered an CrV underlayers have been prepared under varying base pressures, A general improvement in H-c squareness S* and recording performance determined by the media SNR was seen when the base pressure was reduced. Electron diffraction studies have clearly shown that a significant proportion of fee grains are induced when a high base pressure is allowed to remain in the chamber and this is consistent with the presence of residual nitrogen gas in the system.

引用

页码：1576 / 1578

页数：3

共 7 条

[1] NITROGEN-INDUCED FCC PHASE IN RF SPUTTERED CO-CR FILMS HAVING THE HCP PHASE AND PERPENDICULAR MAGNETIC-ANISOTROPY [J].