A versatile double aberration-corrected, energy filtered HREM/STEM for materials science

被引：78

作者：

Hutchison, JL

Titchmarsh, JM

Cockayne, DJH

Doole, RC

Hetherington, CJD

Kirkland, AI

Sawada, H

机构：

[1] Univ Oxford, Dept Mat, Oxford OX1 3PH, England

[2] JEOL Ltd, Akishima, Tokyo 196, Japan

来源：

ULTRAMICROSCOPY | 2005年 / 103卷 / 01期

关键词：

aberration correction; Omega filter; HREM; STEM;

D O I：

10.1016/j.ultramic.2004.11.010

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A HREM/STEM incorporating aberration correctors in both the probe-forming and imaging lenses has been installed at Oxford University. This unique instrument is also equipped with an in-column energy-loss (Omega-type) filter, HAADF detectors above and beneath the filter, and an EDX system. Initial tests have shown it to be capable of similar to 0.1 nm resolution in both TEM and HAADF STEM imaging modes. Some examples of applications are finally presented. (c) 2004 Elsevier B.V. All rights reserved.

引用

页码：7 / 15

页数：9

共 11 条

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