Synchrotron X-ray based characterization of CdZnTe crystals

被引:7
作者
Duff, Martine C. [1 ]
Hunter, Douglas B.
Nuessle, Patterson
Black, David R.
Burdette, Harold
Woicik, Joseph
Burger, Arnold
Groza, Michael
机构
[1] SRNL, Aiken, SC USA
[2] NIST, Gaithersburg, MD 20899 USA
[3] Fisk Univ, Nashville, TN USA
关键词
IR imaging; radiation detectors; semiconductors;
D O I
10.1007/s11664-007-0181-x
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Synthetic CdZnTe (CZT) crystals can be used for the room temperature based detection of gamma radiation. Structural/morphological heterogeneities within CZT, such as secondary phases (namely, precipitates and inclusions), can negatively affect detector performance. We used a synchrotron-based x-ray technique, specifically extended x-ray absorption finestructure (EXAFS) spectroscopy, to determine whether there are differences on a local structural level between intact CZT of high and low radiation detector performance. These studies were complemented by data on radiation detector performance and transmission infrared (IR) imaging. The EXAFS studies revealed no detectable local structural differences between the two types of CZT materials.
引用
收藏
页码:1092 / 1097
页数:6
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